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FORENSIC APPLICATIONS OF THE SCANNING ELECTRON MICROSCOPE

NCJ Number
5349
Journal
JOURNAL OF CRIMINAL LAW, CRIMINOLOGY AND POLICE SCIENCE Volume: 61 Issue: 3 Dated: (SEPTEMBER 1970) Pages: 453-458
Author(s)
E J KORDA; H L MACDONELL
Date Published
1970
Length
6 pages
Annotation
WHEN COMPARED TO OTHER TYPES OF MICROSCOPES, THE SCANNING ELECTRON MICROSCOPE - SEM - WAS SUPERIOR FOR THE PURPOSE OF EXAMINING SURFACE TOPOGRAPHY OF PHYSICAL EVIDENCE.
Abstract
THE CHARACTERISTICS OF THE SEM ARE COMPARED TO THOSE OF THE OPTICAL AND TRANSMISSION ELECTRON MICROSCOPES. SUCH FACTORS AS MAGNIFICATION RANGE, RELATIVE DEPTH OF FOCUS AND TYPE OF OBSERVATION ARE COMPARED AND SUMMARIZED IN TABLE FORM. MICROGRAPHS ARE INCLUDED WHICH COMPARE SPECIFIC APPLICATIONS OF THE THREE MICROSCOPES TO SUCH PHYSICAL EVIDENCE AS BULLETS, CARTRIDGE CASES, IRON WIRE, AND FINGERNAILS.